• DocumentCode
    2560680
  • Title

    Low-resistive textured ZnO thin films grown by MOCVD and photo-MOCVD at very low-temperature of 150 degrees

  • Author

    Yamada, Akira ; Wenas, Wilson W. ; Yoshino, Masahiro ; Konagai, Makoto ; Takahashi, Kiyoshi

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Tokyo Inst. of Technol., Japan
  • fYear
    1991
  • fDate
    7-11 Oct 1991
  • Firstpage
    1236
  • Abstract
    Textured ZnO films were grown by metalorganic chemical vapor deposition (MOCVD) using diethylzinc (DEZ) and H2O as reactant gases. For the low-substrate temperature of 150°C, the surface consists of uniformly sized tetrapod-like features. These undoped films have a high transparency in a wide wavelength range from 400 nm to 1400 nm. The B2H6 gas was also used as a n-type dopant gas to obtain highly conductive ZnO film with a resistivity of 2.4×10-3 Ω-cm. Furthermore, the obtained ZnO films were used to fabricate an a-Si solar cell, and a high conversion efficiency of 11.2% was obtained. A novel photoexcitation process (photo-MOCVD) was employed for the improvement of the film quality, and it was found that the ultraviolet (UV) light irradiation onto the substrate during the growth was very effective in improving the electron mobility
  • Keywords
    CVD coatings; II-VI semiconductors; amorphous semiconductors; electrical conductivity of crystalline semiconductors and insulators; elemental semiconductors; semiconductor growth; semiconductor thin films; silicon; solar cells; zinc compounds; 11.2 percent; 400 to 1400 nm; B2H6 dopant gas; MOCVD; UV irradiation; amorphous Si-ZnO solar cells; diethylzinc; electron mobility; metalorganic chemical vapor deposition; photo-MOCVD; resistivity; semiconductor thin films; Chemical vapor deposition; Conductive films; Conductivity; Gases; MOCVD; Photovoltaic cells; Substrates; Temperature; Transistors; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1991., Conference Record of the Twenty Second IEEE
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-87942-636-5
  • Type

    conf

  • DOI
    10.1109/PVSC.1991.169407
  • Filename
    169407