• DocumentCode
    2560682
  • Title

    LFSROM: Basic Principle and BIST application

  • Author

    Dufaza, C. ; Chevalier, C.

  • Author_Institution
    UMR-CNRS, Univ. Montpellier II, France
  • fYear
    1993
  • fDate
    22-25 Feb 1993
  • Firstpage
    211
  • Lastpage
    216
  • Abstract
    A built-in self test (BIST) approach wherein the on-chip test pattern generator is basically the combination of a LFSR, on OR2 network and a set of multiplexers is described. Given precomputed sequences of deterministic test vectors, it is illustrated by some examples that this LFSROM generator provides data storage performances comparable in quality to a ROM
  • Keywords
    automatic testing; built-in self test; integrated circuit testing; logic testing; read-only storage; shift registers; BIST application; LFSR; LFSROM; OR2 network; data storage performances; deterministic test vectors; on-chip test pattern generator; precomputed sequences; set of multiplexers; Automatic test pattern generation; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Network-on-a-chip; Pattern analysis; Read only memory; Robots; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1993, with the European Event in ASIC Design. Proceedings. [4th] European Conference on
  • Conference_Location
    Paris
  • Print_ISBN
    0-8186-3410-3
  • Type

    conf

  • DOI
    10.1109/EDAC.1993.386474
  • Filename
    386474
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2560682