Title :
A fully CMOS-compitible 672-bit EEPROM for passive RFID tag application
Author :
Baek, Jong-Min ; Chun, Jung-Hoon ; Kwon, Kee-Won ; Kim, Jihong ; Yoo, Myung Ho
Author_Institution :
Dept. of Electr. & Comput. Eng., Sungkyunkwan Univ., Suwon, South Korea
Abstract :
This paper presents a 672-bit electrically erasable programmable read-only memory (EEPROM) fabricated using a conventional 0.13 μm CMOS process. The write voltages are lowered to 6 V and -4 V using the proposed planar cell structure on the isolated p-wells. The amount of electrons removed from the floating gate is regulated by real-time monitoring to reduce the Vth variation of erased cells. The read and write power dissipations are 2.1 μW and 26 μW, respectively, at room temperature.
Keywords :
CMOS memory circuits; EPROM; radiofrequency identification; CMOS-compitible EEPROM; RFID tag; electrically erasable programmable read-only memory; floating gate; isolated p-wells; planar cell structure; power 2.1 muW; power 26 muW; size 0.13 mum; temperature 293 K to 298 K; voltage -4 V; voltage 6 V; word length 672 bit; EPROM; Generators; Logic gates; Nonvolatile memory; Radiofrequency identification; Transistors; Tunneling;
Conference_Titel :
Solid State Circuits Conference (A-SSCC), 2010 IEEE Asian
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-8300-6
DOI :
10.1109/ASSCC.2010.5716636