Title :
Thermal resistance measurements and finite element calculations for ceramic hermetic packages
Author :
Sweet, James N. ; Cooley, William T.
Author_Institution :
Sandia Nat. Lab., Albuquerque, NM, USA
Abstract :
An experimental and numerical characterizations of the heat transfer from a 40 pin leadless chip carrier (LCC) ceramic hermetic package (CHP) are presented. The junction-to-case thermal resistance, θjc, has been measured with the package bottom attached to a heat sink and with the package convectively cooled in a fluid bath. The results of these measurements are compared to the predictions of numerical finite-element calculations, and the dependence of θjc on the thermal properties of the package materials is discussed. For the heat sink case, θjc is dominated by the thermal resistances of the package ceramic and the die-attach layer. A simple analytic linear heat flow model can be used to predict θjc. In the case of the fluid-cooled packages, both the measurements and calculations show that θjc is not a very useful parameter for characterizing heat transfer from a ceramic LCC. In practical situations, the junction-to-ambient temperature drop will depend mainly on the details of the convective cooling at package surfaces
Keywords :
cooling; finite element analysis; packaging; thermal resistance measurement; 40 pin leadless chip carrier; CHP; LCC; analytic linear heat flow model; ceramic LCC; ceramic hermetic packages; characterizing heat transfer; convective cooling; die-attach layer; finite element calculations; fluid bath; fluid-cooled packages; heat sink; heat transfer; junction-to-ambient temperature drop; junction-to-case thermal resistance; numerical characterizations; numerical finite-element calculations; package bottom; package ceramic; package surfaces; thermal resistance measurement; thermal resistances; Ceramics; Cogeneration; Electrical resistance measurement; Finite element methods; Heat sinks; Heat transfer; Packaging; Resistance heating; Semiconductor device measurement; Thermal resistance;
Conference_Titel :
Semiconductor Thermal and Temperature Measurement Symposium, 1990. SEMI-THERM VI, Proceedings., Sixth Annual IEEE
Conference_Location :
Phoenix, AZ
DOI :
10.1109/STHERM.1990.68483