• DocumentCode
    2560821
  • Title

    Kinetics of Photoluminescence of Two-Dimensionally Electron Gas in AlGaN/GaN Heterostructure

  • Author

    Korzhavina, Natalie S. ; Shamirzaev, Timur S. ; Mansurov, Vladimir G. ; Zhuravlev, Konstantin S.

  • Author_Institution
    Inst. of Semicond. Phys., Novosibirsk
  • fYear
    2006
  • fDate
    1-5 July 2006
  • Firstpage
    69
  • Lastpage
    70
  • Abstract
    In this work statistician photoluminescence and photoluminescence kinetics of two-dimensional electron gas (2DEG) in AlGaN/GaN heterostructure has been studied. 2DEG was formed at GaN/AlGaN heterostructure by doping of AlGaN layer. Two lines present in a low temperature (4,2K) PL spectrum of the GaN/AlGaN structure: a line A results from excitonic recombination in GaN and a line B is due to recombination of electron of 2DEG. Transient PL spectra of the structure demonstrate that the line A decay time is shorter than 10-8 sec, while the line B demonstrates a nonexponential decay with duration of several tens of microseconds and a red shift with time after excitation pulse. The experimental results were explained in framework of a model of special separation of two-dimensional electrons and holes localized at acceptors
  • Keywords
    III-V semiconductors; aluminium compounds; electron-hole recombination; gallium compounds; photoluminescence; semiconductor doping; two-dimensional electron gas; 2 K; 2D electron gas; 2DEG; 4 K; AlGaN-GaN; AlGaN/GaN heterostructure; excitonic recombination; low temperature PL spectrum; photoluminescence kinetics; statistician photoluminescence; Aluminum gallium nitride; Charge carrier processes; Doping; Electrons; Gallium nitride; Kinetic theory; Photoluminescence; Radiative recombination; Spontaneous emission; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Materials, 2006. Proceedings. 7th Annual 2006 International Workshop and Tutorials on
  • Conference_Location
    Erlagol, Altai
  • ISSN
    1815-3712
  • Print_ISBN
    5-7782-0646-1
  • Type

    conf

  • DOI
    10.1109/SIBEDM.2006.230310
  • Filename
    1694076