DocumentCode
2560828
Title
Hierarchical test generation for VHDL behavioral models
Author
Rao, Sanat R. ; Pan, Bi-Yu ; Armstrong, James R.
Author_Institution
Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
fYear
1993
fDate
22-25 Feb 1993
Firstpage
175
Lastpage
182
Abstract
In this method, the VHDL model to be tested is represented by its process model graph (PMG). Test sets for individual processes of the model are precomputed and stored in the design library. The Hierarchical Behavioral Test Generator (HBTG) algorithm accepts the PMG and the precomputed tests as inputs, from which it hierarchically constructs a test sequence that tests the functionality of the model. Such an automatic test generation process relieves the modeler of the time-consuming task of developing test-benches. The test sequence generated by HBTG is then used for simulation of the model. Experimental results indicate that the tests generated exercise the model thoroughly
Keywords
automatic testing; design for testability; hardware description languages; high level synthesis; logic testing; VHDL behavioral models; algorithm; automatic test generation process; functionality; hierarchical test generation; high level testability; process model graph; simulation; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer industry; Computer simulation; Design engineering; Hardware; Libraries;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1993, with the European Event in ASIC Design. Proceedings. [4th] European Conference on
Conference_Location
Paris
Print_ISBN
0-8186-3410-3
Type
conf
DOI
10.1109/EDAC.1993.386480
Filename
386480
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