• DocumentCode
    2560828
  • Title

    Hierarchical test generation for VHDL behavioral models

  • Author

    Rao, Sanat R. ; Pan, Bi-Yu ; Armstrong, James R.

  • Author_Institution
    Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • fYear
    1993
  • fDate
    22-25 Feb 1993
  • Firstpage
    175
  • Lastpage
    182
  • Abstract
    In this method, the VHDL model to be tested is represented by its process model graph (PMG). Test sets for individual processes of the model are precomputed and stored in the design library. The Hierarchical Behavioral Test Generator (HBTG) algorithm accepts the PMG and the precomputed tests as inputs, from which it hierarchically constructs a test sequence that tests the functionality of the model. Such an automatic test generation process relieves the modeler of the time-consuming task of developing test-benches. The test sequence generated by HBTG is then used for simulation of the model. Experimental results indicate that the tests generated exercise the model thoroughly
  • Keywords
    automatic testing; design for testability; hardware description languages; high level synthesis; logic testing; VHDL behavioral models; algorithm; automatic test generation process; functionality; hierarchical test generation; high level testability; process model graph; simulation; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer industry; Computer simulation; Design engineering; Hardware; Libraries;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1993, with the European Event in ASIC Design. Proceedings. [4th] European Conference on
  • Conference_Location
    Paris
  • Print_ISBN
    0-8186-3410-3
  • Type

    conf

  • DOI
    10.1109/EDAC.1993.386480
  • Filename
    386480