Title :
Automatic generation algorithms, experiments and comparisons of self-checking PLA schemes using parity codes
Author :
Boudjit, M. ; Nicolaidis, M. ; Torki, K.
Author_Institution :
Reliable Integrated Syst. Group, IMAG/TIMA, Grenoble, France
Abstract :
Self-checking circuits ensure concurrent error detection by means of hardware redundancy. An important drawback of self-checking circuits is that they involve a significant increasing of the circuit area. Recent experiments on Berger-code encoded PLAs result on 46.9% average area overhead. In order to decrease this overhead, the authors present a tool that generates self-checking PLAs using parity encoding for the product terms and the outputs. This tool has been used for experimenting on several benchmark PLAs. In these experiments the authors retain for each PLA case the scheme involving the lower area overhead. Thus the mean overhead is reduced from 46.9% [TCR 91] to 37.2% (24.9% if a PLA named misex3 is not included)
Keywords :
codes; design for testability; logic CAD; logic testing; programmable logic arrays; automatic generation algorithms; concurrent error detection; design for testability; hardware redundancy; mean overhead; parity codes; parity encoding; programmable logic array; self-checking circuits; Channel hot electron injection; Circuit faults; Circuit testing; Electrical fault detection; Encoding; Fault detection; Hardware; Integrated circuit reliability; Minimization; Programmable logic arrays;
Conference_Titel :
Design Automation, 1993, with the European Event in ASIC Design. Proceedings. [4th] European Conference on
Conference_Location :
Paris
Print_ISBN :
0-8186-3410-3
DOI :
10.1109/EDAC.1993.386485