Title :
Thermal performance comparison of high pin count cavity-up enhanced plastic ball grid array (EPBGA) packages
Author_Institution :
LSI Logic Corp., Fremont, CA, USA
fDate :
29 May-1 Jun 1996
Abstract :
Three dimensional finite element models of cavity-up enhanced plastic ball grid array (EPBGA) packages have been developed using ANSYS TM finite element simulation code. The models have been used for thermal characterization of different designs of high pin count EPBGA packages under different air flow conditions with and without an external heat sink. In addition to the design evaluations, the simulations have been repeated to quantify the effect of populated and unpopulated boards on the thermal performance of each EPBGA package with and without a heat sink. For the unpopulated board case, a single package has been modeled on a 10 cm×10 cm×0.16 cm (4"s 4"×0.062") multilayer printed circuit board (PCB). For the populated board, the size has been reduced to the size of the package footprint, and no heat transfer is permitted along the board periphery. Further parametric studies have been performed to predict the thermal performance of EPBGA packages as a function of solder ball counts in the inner solder ball matrix (underneath the cavity). In conjunction, the optimum number of solder balls in the inner matrix has been determined for better heat dissipation through the package to the board via the thermal balls. In addition to the solder ball counts, the importance of the package internal vias connected to the solder balls in the inner matrix is quantified
Keywords :
finite element analysis; integrated circuit packaging; plastic packaging; soldering; thermal analysis; 3D finite element models; ANSYS; air flow conditions; ball grid array packages; cavity-up EPBGA packages; enhanced plastic BGA packages; finite element simulation code; heat dissipation; heat sink; high pin count; inner solder ball matrix; package internal vias; populated boards; solder ball counts; thermal characterization; thermal performance comparison; unpopulated boards; Assembly; Backplanes; Electronic packaging thermal management; Electronics packaging; Finite element methods; Heat sinks; Heat transfer; Parametric study; Plastic packaging; Transmission line matrix methods;
Conference_Titel :
Thermal Phenomena in Electronic Systems, 1996. I-THERM V., Inter-Society Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-3325-X
DOI :
10.1109/ITHERM.1996.534555