DocumentCode
256115
Title
Hybrid silicon and glass interposer for combined optical and memory system-in-package
Author
Uematsu, Y. ; Toyama, M. ; Yorita, C. ; Osaka, H.
Author_Institution
Yokohama Res. Lab., Hitachi Ltd., Yokohama, Japan
fYear
2014
fDate
14-16 Dec. 2014
Firstpage
5
Lastpage
8
Abstract
This paper proposes a low-cost packaging configuration for a combined optical and memory system-in-package. The proposed hybrid silicon and glass configuration meets the wiring density required for HBM and high-frequency characteristics required for optical IC wiring. We also built and tested a wiring TEG to evaluate the high-frequency performance of 25 Gbps differential transmission wiring for optical ICs in the glass interposer region, thereby seeking to minimize losses and reduce power consumption. Experiments showed satisfactory transfer characteristics of □0.8 dB/cm.
Keywords
integrated circuit interconnections; integrated circuit testing; system-in-package; HBM; bit rate 25 Gbit/s; combined optical and memory system-in-package; differential transmission wiring; glass interposer region; high-frequency characteristics; hybrid silicon and glass configuration; low-cost packaging configuration; optical IC wiring; wiring TEG; wiring density; Glass; High-speed optical techniques; Integrated circuits; Integrated optics; Optical fibers; Wiring; 2.5-D integration; Silicon interposer; System in Package; glass interposer;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Design of Advanced Packaging & Systems Symposium (EDAPS), 2014 IEEE
Conference_Location
Bangalore
Type
conf
DOI
10.1109/EDAPS.2014.7030801
Filename
7030801
Link To Document