• DocumentCode
    256115
  • Title

    Hybrid silicon and glass interposer for combined optical and memory system-in-package

  • Author

    Uematsu, Y. ; Toyama, M. ; Yorita, C. ; Osaka, H.

  • Author_Institution
    Yokohama Res. Lab., Hitachi Ltd., Yokohama, Japan
  • fYear
    2014
  • fDate
    14-16 Dec. 2014
  • Firstpage
    5
  • Lastpage
    8
  • Abstract
    This paper proposes a low-cost packaging configuration for a combined optical and memory system-in-package. The proposed hybrid silicon and glass configuration meets the wiring density required for HBM and high-frequency characteristics required for optical IC wiring. We also built and tested a wiring TEG to evaluate the high-frequency performance of 25 Gbps differential transmission wiring for optical ICs in the glass interposer region, thereby seeking to minimize losses and reduce power consumption. Experiments showed satisfactory transfer characteristics of □0.8 dB/cm.
  • Keywords
    integrated circuit interconnections; integrated circuit testing; system-in-package; HBM; bit rate 25 Gbit/s; combined optical and memory system-in-package; differential transmission wiring; glass interposer region; high-frequency characteristics; hybrid silicon and glass configuration; low-cost packaging configuration; optical IC wiring; wiring TEG; wiring density; Glass; High-speed optical techniques; Integrated circuits; Integrated optics; Optical fibers; Wiring; 2.5-D integration; Silicon interposer; System in Package; glass interposer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Design of Advanced Packaging & Systems Symposium (EDAPS), 2014 IEEE
  • Conference_Location
    Bangalore
  • Type

    conf

  • DOI
    10.1109/EDAPS.2014.7030801
  • Filename
    7030801