• DocumentCode
    2561721
  • Title

    Complete scheme for beam hardening correction in small animal computed tomography

  • Author

    de Molina, C. ; Sisniega, A. ; Vaquero, J.J. ; Desco, M. ; Abella, M.

  • Author_Institution
    Dept. de Bioing. e lng. Aerosp., Univ. Carlos III de Madrid, Leganés, Spain
  • fYear
    2012
  • fDate
    Oct. 27 2012-Nov. 3 2012
  • Firstpage
    3835
  • Lastpage
    3838
  • Abstract
    CT images are often affected by beam hardening artifacts due to the polyenergetic nature of the X-ray beam. Several correction methods have been proposed to be included in an FDK reconstruction scheme, which is still the prefered reconstruction algorithm in commercial X-ray CT scanners. In this work, we present a complete correction scheme for beam hardening artifact correction in an FDK-based reconstruction scenario that accounts for both cupping artifact and dark streaks. The proposed method substitutes the need of the knowledge of the spectrum by empirical measurements and two parameters. It includes two steps: a linearization step of projection data and a post-reconstruction step. Evaluation done in real studies acquired with a cone-beam micro-CT scanner showed an average cupping reduction of 80% in homogeneous phantoms and 72% in rodent studies. The correction scheme can be incorporated easily in any cone beam micro-CT scanner.
  • Keywords
    computerised tomography; diagnostic radiography; image reconstruction; medical image processing; phantoms; CT images; FDK reconstruction scheme; X-ray CT scanners; X-ray beam; average cupping reduction; beam hardening artifacts; beam hardening correction scheme; cone-beam microCT scanner; cupping artifact; dark streaks; empirical measurements; homogeneous phantoms; linearization step; polyenergetic nature; post-reconstruction step; projection data; reconstruction algorithm; small animal computed tomography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1082-3654
  • Print_ISBN
    978-1-4673-2028-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2012.6551880
  • Filename
    6551880