Title :
Precision mapping and calibration of electric fields using interference-narrowed Stark resonances
Author :
van der Straten, P. ; Yang, D.-H. ; Lieberman, D. ; Bergeman, T. ; Metcalf, H.
Author_Institution :
State Univ. of New York, Stony Brook, NY, USA
Abstract :
The use of interference narrowing of Stark resonances for three-dimensional mapping of electric fields to an unprecedented level of precision is described. A method for calibration of electric fields to an accuracy currently limited only by theory is proposed. Measurements that were repeatable and reliable to a precision of 10 p.p.m. have been obtained. The accuracy of the method is limited by atomic constants rather than by the measurements of spacers and voltages and it is at least 100 times better than the conventional standard for field calibration.<>
Keywords :
Stark effect; atomic resonant states; calibration; electric field measurement; accuracy; atomic constants; calibration; electric fields; interference-narrowed Stark resonances; three-dimensional mapping; Atomic measurements; Calibration; Electrostatic measurements; Interference; Laser beams; Laser excitation; Magnetic field measurement; Resonance; Spatial resolution; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements, 1990. CPEM '90 Digest., Conference on
Conference_Location :
Ottawa, Ontario, Canada
DOI :
10.1109/CPEM.1990.109975
