Title :
Evidence that degradation in a-Si:H solar cells is an i layer effect
Author :
Redfield, David ; Bube, Richard H.
Author_Institution :
Dept. of Mater. Sci. & Eng., Stanford Univ., CA, USA
Abstract :
Information has been obtained on light-induced degradation and annealing in a-Si:H by the use of homogeneous films, not solar cells. This study summarizes these advances and compares them with data on corresponding effects in cells. This comparison provides consistent evidence that cell degradation can be inferred from the properties of bulk defect generation in films. This evidence comes from anneal kinetics, the existence and properties of saturation, degradation kinetics, thickness dependence of degradation, and performance modeling of films and cells. There seems to be no substantial evidence that cell properties are degraded seriously by other effects. Thus, film properties can be generally used as guides for cell stability
Keywords :
amorphous semiconductors; annealing; elemental semiconductors; hydrogen; silicon; solar cells; amorphous Si:H solar cells; anneal kinetics; annealing; bulk defect generation; degradation kinetics; homogeneous films; light-induced degradation; performance modeling; semiconductor; stability; thickness dependence; Annealing; Degradation; Kinetic theory; Materials science and technology; Metastasis; Photovoltaic cells; Solar power generation; Stability; Steady-state; Temperature;
Conference_Titel :
Photovoltaic Specialists Conference, 1991., Conference Record of the Twenty Second IEEE
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-87942-636-5
DOI :
10.1109/PVSC.1991.169421