Title :
Interferometric measurement with external modulation and recycling: theory and verification
Author :
Dewey, D. ; Man, C.N. ; Manh, P. ; Shoemaker, D.
Author_Institution :
CNRS, Orsay, France
Abstract :
A novel modulation technique for the shot-noise-limited measurement of the different displacement between arms of a Michelson interferometer is presented. Electrooptic modulation is applied to a reference beam external to the Michelson system, avoiding modulator-induced losses and wavefront distortions and allowing efficient power increase through recycled-light operation. Results for initial proof-of-concept experiments are given and show reasonable agreement with theory.<>
Keywords :
displacement measurement; light interferometry; optical modulation; Michelson interferometer; different displacement; electro-optical modulation; external modulation; modulator-induced losses; recycled-light operation; recycling; reference beam; shot-noise-limited measurement; wavefront distortions; Arm; Displacement measurement; Distortion measurement; Electrooptic modulators; Noise measurement; Optical interferometry; Optical modulation; Phase modulation; Photoconductivity; Recycling;
Conference_Titel :
Precision Electromagnetic Measurements, 1990. CPEM '90 Digest., Conference on
Conference_Location :
Ottawa, Ontario, Canada
DOI :
10.1109/CPEM.1990.109989
