DocumentCode :
2562401
Title :
Performance degradation analysis using principal component method
Author :
Yang, Kai ; Yang, Guangbin
Author_Institution :
Dept. of Ind. & Manuf., Wayne State Univ., Detroit, MI, USA
fYear :
1997
fDate :
13-16 Jan 1997
Firstpage :
136
Lastpage :
141
Abstract :
This paper describes a strategy of using the principal component method to analyze the performance characteristics of products. In particular, the authors relate performance characteristics to reliability and propose a relative reliability metric, which is useful in reliability screening. The importance of individual performance characteristics to reliability is evaluated. The importance indicates the critical characteristic and the direction in which efforts should be made to improve the reliability of a product. They use score plots to identify degradation modes and determine dominant degradation mechanisms. The principal component method is applied to analyze the degradation data of infrared light emitting diodes
Keywords :
failure analysis; light emitting diodes; reliability theory; semiconductor device reliability; degradation modes; dominant degradation mechanisms; infrared light emitting diodes; performance degradation analysis; performance reliability characteristics; principal component method; relative reliability metric; reliability screening; score plots; Covariance matrix; Data analysis; Degradation; Eigenvalues and eigenfunctions; Light emitting diodes; Measurement; Performance analysis; Performance loss; Principal component analysis; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium. 1997 Proceedings, Annual
Conference_Location :
Philadelphia, PA
ISSN :
0149-144X
Print_ISBN :
0-7803-3783-2
Type :
conf
DOI :
10.1109/RAMS.1997.571684
Filename :
571684
Link To Document :
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