Title :
Improvements in transmission line permittivity and permeability measurements
Author :
Baker-Jarvis, J. ; Geyer, R. ; Domich, P.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
The transmission/reflection and short-circuit line methods for complex permittivity and permeability determination in transmission-line sample holders are examined. Novel equations for permittivity that eliminate the ill-behaved nature of the commonly used transmission/reflection methods at frequencies corresponding to integer multiples of one-half wavelength in the sample are presented. The equations are also independent of reference plane position. Measurement results and an error analysis are presented. In addition, the scattering equations are solved with an optimization routine which incorporates prior information as constraints.<>
Keywords :
S-parameters; error analysis; magnetic permeability measurement; microwave measurement; optimisation; permittivity measurement; short-circuit currents; complex permittivity; error analysis; integer multiples; optimization; permeability measurements; scattering equations; short-circuit line; transmission line permittivity; transmission-line sample holders; transmission/reflection; Constraint optimization; Equations; Error analysis; Frequency; Permeability; Permittivity measurement; Reflection; Scattering; Transmission lines; Wavelength measurement;
Conference_Titel :
Precision Electromagnetic Measurements, 1990. CPEM '90 Digest., Conference on
Conference_Location :
Ottawa, Ontario, Canada
DOI :
10.1109/CPEM.1990.110002