Title :
The effect of low energy protons on silicon solar cells with simulated coverglass cracks
Author :
Gasner, S. ; Anspaugh, B. ; Francis, R. ; Marvin, D.
Author_Institution :
Lockheed Missiles & Space Co., Sunnyvale, CA, USA
Abstract :
Results of a series of low-energy proton (LEP) tests are presented. The purpose of the tests was to investigate the effect of low-energy protons on the electrical performance of solar cells with simulated cracked covers. The results of the tests were then related to the space environment. A matrix of LEP tests was set up using solar cells with simulated cracks to determine the effect on electrical performance as a function of fluence, energy, crack width, coverglass adhesive shielding, crack location, and solar cell size. The results of the test were, for the most part, logical, and consistent
Keywords :
aerospace testing; elemental semiconductors; semiconductor device testing; silicon; solar cells; space vehicle power plants; Si; adhesive shielding; aerospace testing; coverglass cracks; crack location; crack width; electrical performance; energy; fluence; low energy protons; semiconductor device testing; solar cells; space power; Aerospace testing; Degradation; Laboratories; Logic testing; Missiles; Orbits; Photovoltaic cells; Propulsion; Protons; Silicon;
Conference_Titel :
Photovoltaic Specialists Conference, 1991., Conference Record of the Twenty Second IEEE
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-87942-636-5
DOI :
10.1109/PVSC.1991.169446
