DocumentCode
2562879
Title
Dislocations and defect structure around micro-indentations and Te precipitates in CdTe
Author
Babentsov, V. ; Sizov, F. ; Franc, Jan ; Fochuk, Petro ; Yang, Guo-Min ; Bolotnikov, Alexander ; James, Ralph B.
Author_Institution
Inst. for Semicond. Phys., Kiev, Ukraine
fYear
2012
fDate
Oct. 27 2012-Nov. 3 2012
Firstpage
4128
Lastpage
4130
Abstract
We investigated dislocation-related electronic states induced by dislocation motion in CdTe-based semiconductors. Dislocations cause various types of electronic defect states in the bandgap of semiconductors, namely, defects created by different types of dislocations, and those due to an impurity or native defect segregated around the dislocations. The aim of this work was to further clarify, on the basis of an analysis of the lattice deformation, whether these defects belong to either the Te or Cd sublattice and to formulate a model describing such defects.
Keywords
II-VI semiconductors; cadmium compounds; crystal structure; deformation; dislocation motion; energy gap; indentation; precipitation (physical chemistry); segregation; semiconductor counters; tellurium compounds; Cd sublattice; CdTe-based semiconductors; CeTe; Te precipitates; Te sublattice; bandgap; defect structure; dislocation motion; dislocation-related electronic states; electronic defect states; lattice deformation; microindentations; native defect;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location
Anaheim, CA
ISSN
1082-3654
Print_ISBN
978-1-4673-2028-3
Type
conf
DOI
10.1109/NSSMIC.2012.6551943
Filename
6551943
Link To Document