• DocumentCode
    2562879
  • Title

    Dislocations and defect structure around micro-indentations and Te precipitates in CdTe

  • Author

    Babentsov, V. ; Sizov, F. ; Franc, Jan ; Fochuk, Petro ; Yang, Guo-Min ; Bolotnikov, Alexander ; James, Ralph B.

  • Author_Institution
    Inst. for Semicond. Phys., Kiev, Ukraine
  • fYear
    2012
  • fDate
    Oct. 27 2012-Nov. 3 2012
  • Firstpage
    4128
  • Lastpage
    4130
  • Abstract
    We investigated dislocation-related electronic states induced by dislocation motion in CdTe-based semiconductors. Dislocations cause various types of electronic defect states in the bandgap of semiconductors, namely, defects created by different types of dislocations, and those due to an impurity or native defect segregated around the dislocations. The aim of this work was to further clarify, on the basis of an analysis of the lattice deformation, whether these defects belong to either the Te or Cd sublattice and to formulate a model describing such defects.
  • Keywords
    II-VI semiconductors; cadmium compounds; crystal structure; deformation; dislocation motion; energy gap; indentation; precipitation (physical chemistry); segregation; semiconductor counters; tellurium compounds; Cd sublattice; CdTe-based semiconductors; CeTe; Te precipitates; Te sublattice; bandgap; defect structure; dislocation motion; dislocation-related electronic states; electronic defect states; lattice deformation; microindentations; native defect;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1082-3654
  • Print_ISBN
    978-1-4673-2028-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2012.6551943
  • Filename
    6551943