DocumentCode :
2562927
Title :
Charge multiplication in CdZnTe Schottky barrier diode detectors at alpha-particles registration
Author :
Ivanov, V. ; Loutchanski, A. ; Dorogov, P. ; Shorohov, M.
Author_Institution :
ZRF RlTEC SIA, Riga, Latvia
fYear :
2012
fDate :
Oct. 27 2012-Nov. 3 2012
Firstpage :
4138
Lastpage :
4141
Abstract :
The planar detectors with Schottky barrier diode structure (Au/CdZnTe/In) were investigated using alpha-particle response characterisation. At irradiation of a negative In contact by alpha-particles of 5.5 MeV slow pulses with extremely large amplitude, exceeding in tens times the amplitude of the pulses when operating at the reverse bias have been found. To study this phenomenon a special charge-sensitive preamplifier with low charge sensitivity and a large decay time constant has been used. Was found that the amplitude of the output pulses obtained with detectors having Schottky barrier diode structure at the forward biases exceed in many times the amplitude of output pulses obtained with planar conductive detector (Au/CdZnTe/Au) fabricated of the same crystal. Irradiation of a negative contact of the conductive detector with a laser visible light (635 nm) leads to the similar effect.
Keywords :
II-VI semiconductors; Schottky barriers; Schottky diodes; alpha-particles; cadmium compounds; electrical contacts; gold; indium; laser beam effects; metal-semiconductor-metal structures; semiconductor counters; wide band gap semiconductors; zinc compounds; Au-CdZnTe-In; Schottky barrier diode detectors; Schottky barrier diode structure; alpha-particle response characterisation; charge multiplication; charge sensitivity; charge-sensitive preamplifier; conductive detector; electron volt energy 5.5 MeV; forward biases; large decay time constant; laser visible light; negative contact irradiation effect; output pulses; planar conductive detector; planar detectors; reverse bias effect; wavelength 635 nm;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1082-3654
Print_ISBN :
978-1-4673-2028-3
Type :
conf
DOI :
10.1109/NSSMIC.2012.6551946
Filename :
6551946
Link To Document :
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