• DocumentCode
    2562999
  • Title

    Proton and electron irradiation of MOCVD InP solar cells: Experimental results and radiation modeling

  • Author

    Walters, R.J. ; Messenger, S.R. ; Summers, G.P. ; Burke, E.A. ; Keavney, C.J.

  • Author_Institution
    US Naval Res. Lab., Washington, DC, USA
  • fYear
    1991
  • fDate
    7-11 Oct 1991
  • Firstpage
    1560
  • Abstract
    1 MeV electron and 10 MeV proton irradiation of high-efficiency (>18%, 1 sun, AM0) InP solar cells grown by metalorganic chemical vapor deposition (MOCVD) is reported. The MOCVD InP cells are shown to be more radiation resistant than Si and GaAs cells, especially at high fluences. Deep-level transient spectroscopy (DLTS) measurements on the InP solar cells are reported. The defect behavior is compared with cell parameters following irradiation and subsequent annealing stages. The correlation between changes in the solar cell output and the majority carrier (hole) DLTS spectrum reported in irradiated diffused junction InP was not observed in MOCVD InP. An approach to correlating electron- and proton-induced damage in InP solar cells based on calculations of the nonionizing energy loss (NIEL) is described
  • Keywords
    CVD coatings; III-V semiconductors; annealing; chemical vapour deposition; deep level transient spectroscopy; electron beam effects; indium compounds; proton effects; solar cells; DLTS; InP; MOCVD InP solar cells; annealing; deep-level transient spectroscopy; defect behavior; electron irradiation; high-efficiency; metalorganic chemical vapor deposition; nonionizing energy loss; proton irradiation; radiation modeling; Annealing; Chemical vapor deposition; Electrons; Gallium arsenide; Indium phosphide; MOCVD; Photovoltaic cells; Protons; Spectroscopy; Sun;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1991., Conference Record of the Twenty Second IEEE
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-87942-636-5
  • Type

    conf

  • DOI
    10.1109/PVSC.1991.169466
  • Filename
    169466