• DocumentCode
    2563004
  • Title

    The modified exponentiated-Weibull distribution for life-time modeling

  • Author

    Gera, Amos E.

  • Author_Institution
    ELTA Electron. Ind. Ltd., Ashdod, Israel
  • fYear
    1997
  • fDate
    13-16 Jan 1997
  • Firstpage
    149
  • Lastpage
    152
  • Abstract
    The so-called “exponentiated Weibull distribution” has been offered as a simple generalization of the Weibull distribution. It is well suited for modeling bathtub failure rate lifetime data. A modified version of this distribution is presented to meet the problem of bandlimited input data on failure times. This is seen to yield a more pessimistic MTBF value which is more realistic in case of lack of information. The use of the new distribution for lifetime modeling of a bathtub type distribution is demonstrated using experimental data. A closed form series expansion is also supplied to exhibit the dependence of the MTBF upon the parameters of the distribution. This is shown to yield an upper bound on the value of the MTBF. In some cases it may serve as an efficient approximation for its evaluation
  • Keywords
    Weibull distribution; failure analysis; reliability theory; MTBF value; bandlimited input data; bathtub failure rate modelling; failure times; life-time modeling; modified exponentiated-Weibull distribution; Aging; Bandwidth; Data analysis; Exponential distribution; Hazards; Integral equations; Maximum likelihood estimation; Shape; Upper bound; Weibull distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium. 1997 Proceedings, Annual
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-3783-2
  • Type

    conf

  • DOI
    10.1109/RAMS.1997.571690
  • Filename
    571690