DocumentCode
2563287
Title
Soft error estimates for fabless companies
Author
Dixit, Anand ; Heald, Raymond
Author_Institution
Sun Microsyst., Santa Clara, CA, USA
fYear
2009
fDate
18-20 May 2009
Firstpage
125
Lastpage
127
Abstract
Soft errors have gained in importance over the years. Until recently only the large microprocessor and memory companies were interested in this reliability issue. However, with increasingly large number of devices on a chip, smaller fabless companies must now contend with it. Only a few companies have the extensive knowledge of the process and the required expertise in high energy physics to characterize the soft error rate based on first principles. This paper examines this issue and provides guidance on how to characterize the soft error rate of chips using circuit simulation for current technology nodes.
Keywords
error statistics; reliability; semiconductor industry; circuit simulation; fabless companies; memory companies; microprocessor companies; reliability issue; soft error estimation; soft error rate; Circuit simulation; Computer errors; Error analysis; Error correction codes; Latches; Logic; Master-slave; Microprocessors; Sun; Voltage; FIT rate; fabless; flip flop; single error event; soft error;
fLanguage
English
Publisher
ieee
Conference_Titel
IC Design and Technology, 2009. ICICDT '09. IEEE International Conference on
Conference_Location
Austin, TX
Print_ISBN
978-1-4244-2933-2
Electronic_ISBN
978-1-4244-2934-9
Type
conf
DOI
10.1109/ICICDT.2009.5166279
Filename
5166279
Link To Document