• DocumentCode
    2563287
  • Title

    Soft error estimates for fabless companies

  • Author

    Dixit, Anand ; Heald, Raymond

  • Author_Institution
    Sun Microsyst., Santa Clara, CA, USA
  • fYear
    2009
  • fDate
    18-20 May 2009
  • Firstpage
    125
  • Lastpage
    127
  • Abstract
    Soft errors have gained in importance over the years. Until recently only the large microprocessor and memory companies were interested in this reliability issue. However, with increasingly large number of devices on a chip, smaller fabless companies must now contend with it. Only a few companies have the extensive knowledge of the process and the required expertise in high energy physics to characterize the soft error rate based on first principles. This paper examines this issue and provides guidance on how to characterize the soft error rate of chips using circuit simulation for current technology nodes.
  • Keywords
    error statistics; reliability; semiconductor industry; circuit simulation; fabless companies; memory companies; microprocessor companies; reliability issue; soft error estimation; soft error rate; Circuit simulation; Computer errors; Error analysis; Error correction codes; Latches; Logic; Master-slave; Microprocessors; Sun; Voltage; FIT rate; fabless; flip flop; single error event; soft error;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IC Design and Technology, 2009. ICICDT '09. IEEE International Conference on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-2933-2
  • Electronic_ISBN
    978-1-4244-2934-9
  • Type

    conf

  • DOI
    10.1109/ICICDT.2009.5166279
  • Filename
    5166279