DocumentCode :
2563313
Title :
Liquid encapsulated MCM package-thermal demonstration
Author :
Lee, Tien-Yu Tom ; Hause, Vem ; Mahalingam, Mali
Author_Institution :
Simulation & Design Center, Motorola Inc., Tempe, AZ, USA
fYear :
1996
fDate :
29 May-1 Jun 1996
Firstpage :
258
Lastpage :
265
Abstract :
This experimental study was undertaken to demonstrate the capability of liquid-encapsulated system in its simplest form of implementation to cool an MCM package. The MCM package was made of kovar (dimension: 58×35×11 mm). Two silicon thermal test chips were bonded to an FR-4 board and housed inside the metal package. Tests were performed on both dry (no liquid-filled) and liquid-filled packages. In the liquid-filled situation, either a pure dielectric liquid or a dielectric liquid mixture was employed. The MCM package was externally cooled by either free-air or forced-air (1.0 to 2.54 m/s of air flow). Heat transfer history from single-phase, through nucleate boiling, to film boiling was documented. The overall improvement for the liquid-filled package was 2-4 times compared to the dry package, due to the superior thermal properties of dielectric liquids compared to air. The maximum power dissipation in the liquid-filled package at 2.54 m/s external air flow was 18 W (based on junction temperature maximum of 125°C). In the liquid-filled package, both the single-phase and boiling heat transfer were enhanced by varying the external boundary conditions from free-air to forced-air. The total power dissipation limit in the liquid-filled package is strongly influenced by the ability to condense the vapor in the package. By changing the boundary conditions from free-air to forced-air (2.54 m/s), the condenser (top lid) efficiency is raised, thus raising the maximum power dissipation by 2.5 times
Keywords :
condensation; cooling; dielectric liquids; encapsulation; film boiling; forced convection; integrated circuit packaging; multichip modules; natural convection; 1.0 to 2.54 m/s; 125 degC; 18 W; FR-4 board; cooling; dielectric liquid mixture; external boundary conditions; film boiling; forced-air flow; free-air flow; heat transfer history; junction temperature maximum; kovar; liquid encapsulated MCM package; liquid-filled packages; nucleate boiling; power dissipation; pure dielectric liquid; thermal test chips; top lid efficiency; vapour condensation; Bonding; Boundary conditions; Dielectric liquids; Heat transfer; History; Packaging; Performance evaluation; Power dissipation; Silicon; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal Phenomena in Electronic Systems, 1996. I-THERM V., Inter-Society Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-3325-X
Type :
conf
DOI :
10.1109/ITHERM.1996.534571
Filename :
534571
Link To Document :
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