DocumentCode
2563366
Title
2D micro particle assembly using atomic force microscope
Author
Sitti, Metin ; Hirahara, Kiyotaka ; Hashimoto, Hideki
Author_Institution
Inst. of Ind. Sci., Tokyo Univ., Japan
fYear
1998
fDate
25-28 Nov 1998
Firstpage
143
Lastpage
148
Abstract
A micro particle manipulation system using atomic force microscope (AFM) as the manipulator has been proposed. The size of the particles to be manipulated are approximately 1-2 μm. Optical microscope (OM) is utilized as the vision sensor, and AFM cantilever behaves also as a force sensor which enables contact point detection and surface alignment sensing. A 2D OM real-time image feedback constitutes the main user interface of the directly teleoperated operation system, where the operator uses mouse cursor and keyboard for defining the trajectories for the AFM controller. Particle manipulation experiments are realized for 2.02 μm gold-coated latex particles, and it is shown that the system can be utilized in 2-D micro particle assembling
Keywords
atomic force microscopy; force sensors; micromanipulators; telecontrol; 1 to 2 micron; 2D micro particle assembly; atomic force microscope; contact point detection; directly teleoperated operation system; force sensor; micro particle manipulation system; particle manipulation experiments; real-time image feedback; surface alignment sensing; vision sensor; Assembly; Atom optics; Atomic force microscopy; Force sensors; Mice; Optical feedback; Optical microscopy; Optical sensors; Real time systems; User interfaces;
fLanguage
English
Publisher
ieee
Conference_Titel
Micromechatronics and Human Science, 1998. MHS '98. Proceedings of the 1998 International Symposium on
Conference_Location
Nagoya
Print_ISBN
0-7803-5130-4
Type
conf
DOI
10.1109/MHS.1998.745768
Filename
745768
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