• DocumentCode
    2563366
  • Title

    2D micro particle assembly using atomic force microscope

  • Author

    Sitti, Metin ; Hirahara, Kiyotaka ; Hashimoto, Hideki

  • Author_Institution
    Inst. of Ind. Sci., Tokyo Univ., Japan
  • fYear
    1998
  • fDate
    25-28 Nov 1998
  • Firstpage
    143
  • Lastpage
    148
  • Abstract
    A micro particle manipulation system using atomic force microscope (AFM) as the manipulator has been proposed. The size of the particles to be manipulated are approximately 1-2 μm. Optical microscope (OM) is utilized as the vision sensor, and AFM cantilever behaves also as a force sensor which enables contact point detection and surface alignment sensing. A 2D OM real-time image feedback constitutes the main user interface of the directly teleoperated operation system, where the operator uses mouse cursor and keyboard for defining the trajectories for the AFM controller. Particle manipulation experiments are realized for 2.02 μm gold-coated latex particles, and it is shown that the system can be utilized in 2-D micro particle assembling
  • Keywords
    atomic force microscopy; force sensors; micromanipulators; telecontrol; 1 to 2 micron; 2D micro particle assembly; atomic force microscope; contact point detection; directly teleoperated operation system; force sensor; micro particle manipulation system; particle manipulation experiments; real-time image feedback; surface alignment sensing; vision sensor; Assembly; Atom optics; Atomic force microscopy; Force sensors; Mice; Optical feedback; Optical microscopy; Optical sensors; Real time systems; User interfaces;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micromechatronics and Human Science, 1998. MHS '98. Proceedings of the 1998 International Symposium on
  • Conference_Location
    Nagoya
  • Print_ISBN
    0-7803-5130-4
  • Type

    conf

  • DOI
    10.1109/MHS.1998.745768
  • Filename
    745768