DocumentCode :
2563463
Title :
Study on fabrication of high aspect ratio electrostatic microactuators using LIGA process
Author :
Kondo, Ryoji ; Suzuki, Kenichiro ; Sugiyama, Susumu
Author_Institution :
Ritsumeikan Univ., Kyoto, Japan
fYear :
1998
fDate :
25-28 Nov 1998
Firstpage :
155
Lastpage :
160
Abstract :
The fabrication of high-power electrostatic microactuators by the LIGA process has been investigated. Advantages of electrostatic microactuators fabricated by the LIGA process are discussed. The basic structure of the microactuators was composed of movable and fixed electrodes of Ni, an isolation layer of SiO2 and a Si substrate, which was fabricated by one mask process. As design rules, a minimum resist width of 2 μm, resist height of 120 μm, maximum width of movable parts of 10 μm, minimum width of fixed parts of 40 μm and driving voltage of about 100 V, were decided on. A 120 μm-thick PMMA resist was formed on a Si substrate by a casting method. The PMMA was exposed using a compact SR source “AURORA”, using an X-ray mask with 7 μm-thick Au absorber on a 2 μm-thick poly-Si membrane. The exposed PMMA was developed by GG developer. Ni microstructures with 100 μm-height, 2 μm-minimum width, maximum aspect ratio of 50, 2 μm-minimum gap were made by electroforming. The average surface roughness of the PMMA microstructure´s sidewall and Ni microstructure´s sidewall were 9.4 nm and 23.1 nm, respectively. Ni microstructures used for movable electrodes were separated from the substrate by lateral etching of SiO 2
Keywords :
LIGA; X-ray masks; electrostatic actuators; isolation technology; photoresists; 10 micron; 100 V; 120 micron; 2 micron; 40 micron; GG developer; LIGA process; Ni-SiO2-Si; PMMA resist; aspect ratio; casting method; design rules; driving voltage; electroforming; electrostatic microactuators; fixed electrodes; isolation layer; lateral etching; mask process; movable electrodes; resist height; resist width; surface roughness; Casting; Electrodes; Electrostatics; Fabrication; Microactuators; Microstructure; Process design; Resists; Strontium; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micromechatronics and Human Science, 1998. MHS '98. Proceedings of the 1998 International Symposium on
Conference_Location :
Nagoya
Print_ISBN :
0-7803-5130-4
Type :
conf
DOI :
10.1109/MHS.1998.745772
Filename :
745772
Link To Document :
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