High-precision analog-to-digital converter testing using Walsh transform

The authors present the theoretical basis underlying an innovative and unified set of parameters based on Walsh functions for testing the transfer function of analog-to-digital converters. The system presented is an enhanced version of an earlier system introduced by A. Brandolini (IEEE Instrum./Meas. Technol. Conference, 1988, San Diego, CA, USA) and provides the highest accuracy in the evaluation of the performance of conversion devices, especially under dynamic conditions. The parameters are defined by mathematical algorithms based on Walsh functions and transform, and their properties are correlated to input signal changes performed by the system. The theory represents the first approach to generalizing the conversion processes using a unified tool to understand their deep operativitiy. This methodology can be seen as the first approach to introducing standard techniques that constitute the reference in testing conversion devices.<>