DocumentCode :
2564103
Title :
WIP evolution of a semiconductor factory after a bottleneck workcenter breakdown
Author :
Rose, Oliver
Author_Institution :
Inst. of Comput. Sci., Wurzburg Univ., Germany
Volume :
2
fYear :
1998
fDate :
13-16 Dec 1998
Firstpage :
997
Abstract :
In semiconductor fabrication facilities, an increase in work in progress (WIP) can be observed even weeks after the failure of the bottleneck workcenter. We develop a simple fab model that facilitates the study of this phenomenon. The simplified factory consists of a detailed model of the bottleneck workcenter and a delay unit that represents the rest of the factory. After passing the delay unit, the lots are fed back to the bottleneck to model the cyclic flow of lots of real wafer fabs. We study the behavior of this model for numerous scenarios, and it turns out that by means of the model, the WIP increase phenomenon can successfully be reproduced. In addition, we provide first results on how to avoid the unwanted increase in inventory
Keywords :
digital simulation; semiconductor device manufacture; stock control; WIP evolution; WIP increase phenomenon; bottleneck workcenter; bottleneck workcenter breakdown; cyclic flow; delay unit; inventory control; real wafer fabs; semiconductor fabrication facilities; semiconductor factory; simple fab model; simplified factory; work in progress; Computer science; Delay effects; Dispatching; Electric breakdown; Fabrication; Memory management; Production facilities; Semiconductor device breakdown; Semiconductor device modeling; Steady-state;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation Conference Proceedings, 1998. Winter
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5133-9
Type :
conf
DOI :
10.1109/WSC.1998.745805
Filename :
745805
Link To Document :
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