Title :
A comparison of sensitivity to location errors in mathematical transformation of arbitrary electromagnetic fields
Author_Institution :
IBM Corp, Endicott, NY, USA
Abstract :
A comparison is made of three methods of mathematically transforming arbitrary electromagnetic fields from measurements of the power spectral density made in the near field: the point matching method, the diffraction method, and the random mode method. The methods are compared in terms of sensitivity to location errors, storage, and computational requirements. The results are verified by a computer simulation of an arbitrary source.<>
Keywords :
digital simulation; electrical engineering computing; electromagnetic field theory; field strength measurement; transforms; arbitrary electromagnetic fields; computational requirements; computer simulation; diffraction; location errors; mathematical transformation; near field; point matching; power spectral density; random mode; storage; Density measurement; Diffraction; Electromagnetic fields; Integral equations; Magnetic field measurement; Moment methods; Partial differential equations; Polarization; Position measurement; Wave functions;
Conference_Titel :
Precision Electromagnetic Measurements, 1990. CPEM '90 Digest., Conference on
Conference_Location :
Ottawa, Ontario, Canada
DOI :
10.1109/CPEM.1990.110084