DocumentCode :
2564373
Title :
Designing to safe power limits in hybrid circuits
Author :
Norwood, David
Author_Institution :
Sandia Nat. Lab., Albuquerque, NM, USA
fYear :
1988
fDate :
9-11 May 1988
Firstpage :
648
Lastpage :
657
Abstract :
Experiments were performed at two heat-transfer conditions, simulating minimum and maximum heat transfer. Since hybrid-circuit heat dissipation is dependent on factors such as heat sinking, package design, substrate material, environment and other considerations, it was decided to bracket the extremes of power dissipation for these circuits. Tests performed at these two heat-transfer conditions yielded data which were used to formulate relationships among the hybrid variables of temperature, size, and power. To establish these relationships, the various sizes of resistors and hybrid substrates were accommodated by using the ratio of resistor to substrate size to relate the power density and temperature. Both resistor and substrate temperature were predictable within the desired temperature limits of 0 to 300°C using the relationships developed. The power-temperature relationships developed make possible the predictions of both resistor and substrate temperatures during circuit design, which is both necessary and advantageous for the design of hybrid circuits having increased power and circuit density
Keywords :
heat transfer; hybrid integrated circuits; integrated circuit testing; packaging; thin film circuits; 0 to 300 C; circuit density; environment; heat sinking; heat-transfer; hybrid substrates; hybrid-circuit heat dissipation; package design; power density; resistors; safe power limits; substrate material; substrate temperature; thin film circuits; Circuit simulation; Circuit synthesis; Circuit testing; Heat sinks; Heat transfer; Packaging; Performance evaluation; Power dissipation; Resistors; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Components Conference, 1988., Proceedings of the 38th
Conference_Location :
Los Angeles, CA
Type :
conf
DOI :
10.1109/ECC.1988.12662
Filename :
12662
Link To Document :
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