DocumentCode :
2564488
Title :
Nb/Al/sub 2/O/sub 3//Nb-Josephson voltage standards at 1 volt and 10 volt
Author :
Popel, R. ; Niemeyer, J. ; Fromknecht, R. ; Meier, W. ; Grimm, L.
Author_Institution :
Phys.-Tech. Bundesanstalt, Braunschweig, West Germany
fYear :
1990
fDate :
11-14 June 1990
Firstpage :
38
Lastpage :
39
Abstract :
Series array Josephson voltage standards in Nb/Al/sub 2/O/sub 3//Nb technology producing stable reference voltages up to 12 V with step amplitudes of about 70 mu A are reported. The 1-V standard chips contain 2000 tunnel junctions, and the 10-V standard chips 20,000 junctions. The 10-v design has been optimized to reduce the total circuit area to 10 mm*27 mm and the total active tunnel junction area to only 7 mm*13 mm The incident microwave power at 70 GHz is distributed over 64 parallel stripline paths. At 10 V, the voltage steps are usually stable for 30 min. The best result achieved was 80 min. This, allows the long-term output voltage recording of a series connection of Weston cells, the direct calibration of 10-V Zener reference standards, linearity measurements of digital voltmeters, and the determination of the noise spectra of Zener references and Weston cells.<>
Keywords :
Josephson effect; Zener diodes; aluminium compounds; calibration; digital voltmeters; measurement standards; niobium; primary cells; reference circuits; superconducting junction devices; voltage measurement; 1 V; 10 V; 30 min; 70 GHz; 70 muA; 80 min; Josephson voltage standards; Nb-Al/sub 2/O/sub 3/-Nb; Weston cells; Zener reference standards; digital voltmeters; direct calibration; incident microwave power; linearity measurements; noise spectra; parallel stripline paths; series array; stable reference voltages; standard chips; tunnel junctions; Calibration; Design optimization; Digital recording; Linearity; Measurement standards; Microwave circuits; Niobium; Noise measurement; Stripline; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements, 1990. CPEM '90 Digest., Conference on
Conference_Location :
Ottawa, Ontario, Canada
Type :
conf
DOI :
10.1109/CPEM.1990.110098
Filename :
110098
Link To Document :
بازگشت