DocumentCode :
2564505
Title :
Deposition of siox oxygen barrier films by atmospheric pressure plasma jet
Author :
Zhongwei Liu ; Qiang Chen ; Zhengduo Wang ; Lijun Sang
Author_Institution :
Lab. of Plasma Phys. & Mater., Beijing Inst. of Graphic Commun., Beijing, China
fYear :
2012
fDate :
8-13 July 2012
Abstract :
Atmospheric pressure plasma jet is a relatively new source of non-equilibrium atmospheric pressure plasmas. Compared to other techniques such as plane-parallel electrodes DBDs, the jet can be used for not only flat and thin substrates but large three-dimensional structures, because the jet is not limited by electrodes and the dimension of emerging plasma varies from several cm down to the sub-mm region. The present work reports the deposition of silicon dioxide film on polyimide (PI) samples by atmospheric pressure plasma jet (APPJ), which operates by feeding the mixture of hexamethyldisiloxane (HMDSO) and nitrogen between two coaxial electrodes that are driven by a 20.8 kHz power source. The films were analyzed using scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS) and FT-IR spectroscopy. The film barrier properties have been improved remarkably. In certain experimental conditions (input power 250 W, nitrogen flow rate 10 SLM), the oxygen transmission rate decreases from virgin PI 160 cc/(m2 day atm) to 0.8 cc/(m2 day atm). The effects of process parameters, such as discharge input power, nitrogen flow rate and reaction position on film barrier property have been investigated.
Keywords :
Fourier transform spectra; X-ray photoelectron spectra; discharges (electric); electrodes; infrared spectra; nitrogen; organic compounds; oxygen; plasma deposition; plasma diagnostics; plasma jets; plasma sources; scanning electron microscopy; silicon compounds; thin films; DBD; FT-IR spectroscopy; N; O2; SiOx; SiOx oxygen barrier film deposition; X-ray photoelectron spectroscopy; atmospheric pressure plasma jet; coaxial electrodes; dielectric barrier discharge; discharge input power; experimental conditions; film barrier properties; frequency 20.8 kHz; hexamethyldisiloxane-nitrogen mixture; nitrogen flow rate; nonequilibrium atmospheric pressure plasma source; oxygen transmission rate; plane-parallel electrodes; polyimide samples; power 250 W; pressure 1 atm; scanning electron microscopy; silicon dioxide film deposition; submm region; three-dimensional structures; Electrodes; Films; Nitrogen; Oxygen; Plasmas; Scanning electron microscopy; Spectroscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science (ICOPS), 2012 Abstracts IEEE International Conference on
Conference_Location :
Edinburgh
ISSN :
0730-9244
Print_ISBN :
978-1-4577-2127-4
Electronic_ISBN :
0730-9244
Type :
conf
DOI :
10.1109/PLASMA.2012.6383881
Filename :
6383881
Link To Document :
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