Title :
Dependence of the dielectric properties of polyethylene insulation subject to water ingress with and without electrical aging
Author :
Bernier, Simon ; Parpal, Jean-Luc ; David, Éric ; Jean, Daniel ; Lalancette, Daniel
Author_Institution :
Ecole de Technol. Super. (ETS), Montreal, QC, Canada
fDate :
May 31 2009-June 3 2009
Abstract :
This paper reports on dielectric loss and dielectric strength measurements obtained on miniature cables soaked in water without voltage (hydrated) and under 5 kVrms voltage (aged). The dielectric losses were measured in polarization and depolarization using a Time Domain Spectroscopy (TDS) diagnostic system developed in-house. The dielectric strength of miniature cables under AC voltage was measured with the cable terminations immersed in a silicone oil bath. The test results showed that the dielectric loss increase solely depends on the water ingress in the insulation for a conditioning time ~1000 h. Passed this threshold time, the dielectric loss increase is correlated to the maximum bow-tie tree length. The dielectric strength results are presented using a Weibull distribution and no correlation was observed between the breakdown values and the bow-tie tree lengths.
Keywords :
Weibull distribution; dielectric loss measurement; electric strength; polyethylene insulation; spectroscopy; underground cables; Weibull distribution; dielectric loss measurement; dielectric strength measurement; polyethylene insulation; silicone oil bath; time domain spectroscopy; underground cables; water ingress; Aging; Dielectric breakdown; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Dielectrics and electrical insulation; Loss measurement; Polyethylene; Voltage; Water;
Conference_Titel :
Electrical Insulation Conference, 2009. EIC 2009. IEEE
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4244-3915-7
Electronic_ISBN :
978-1-4244-3917-1
DOI :
10.1109/EIC.2009.5166351