Title :
High speed comparator for flash ADC and UWB application in 130 nm CMOS technology
Author :
Marvast, M. J Taghizadeh ; Ali, M. A Mohd
Author_Institution :
Dept. of Electr. Electron. & Syst. Eng., Univ. Kebangsaan Malaysia, Bangi, Malaysia
Abstract :
High speed comparator for high-speed flash analog-to-digital converter (ADC) and ultra wideband applications that can work at a sampling rate of 7 GS/s is presented in this paper. This fully differential comparator consists of three stages using a new structure to improve its performance. The offset voltage of the designed comparator has been reduced by means of an active positive feedback. The analyses and simulation results were obtained by using 130 nm CMOS parameters. The comparator can operate with a 1 V peak-to-peak input range consuming 371 μW. The predicted performance is verified by analyses and simulations using HSPICE tool.
Keywords :
CMOS memory circuits; analogue-digital conversion; comparators (circuits); flash memories; ultra wideband technology; CMOS parameters; HSPICE tool; UWB Application; analog-to-digital converter; flash ADC; high speed comparator; power 371 muW; size 130 nm; ultra wideband; voltage 1 V; CMOS technology; Circuits; Energy consumption; Feedback; Inductors; Linearity; Preamplifiers; Sampling methods; Ultra wideband technology; Voltage; Analog-to-digital converter; comparator; flash; high speed; preamplifier;
Conference_Titel :
Signal and Image Processing Applications (ICSIPA), 2009 IEEE International Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4244-5560-7
DOI :
10.1109/ICSIPA.2009.5478686