Title :
Visible spectroscopy characterization of aluminum X pinch plasmas
Author :
Blesener, K.S. ; Blesener, I.C. ; Hammer, D.A. ; Doron, R. ; Maron, Y. ; Kroupp, E. ; Bernshtam, V. ; Weingarten, L. ; Zarnitsky, Y.
Author_Institution :
Lab. of Plasma Studies, Cornell Univ., Ithaca, NY, USA
Abstract :
We are initiating an experiment in which time resolved visible spectroscopy will be used to characterize the plasma in and near the minidiode in aluminum (Al) X pinches. The goal of the experiment is to determine the magnetic field and other plasma conditions near the outer radius of the imploding z-pinch in the minidiode. At this location the conditions should be suitable for a magnetic field measurement using the Al doublet previously used for Zeeman Broadening measurements at the Weizmann Institute of Science.1 We will be studying 2-wire and hybrid X pinches on the 13kA 430ns rise time Low Current Pulser 3 (LCP3), the 20kA 200ns rise time Low Current Pulser 4 (LCP4), and at ≥ 200kA on the 50ns rise time XP generator. By using various pulsers and current levels we aim to study directly the impact that the driving current has on the development of the minidiode of the X pinch, the magnetic field, the electron temperature, and the electron density as a function of time and space. Preliminary results will be presented.
Keywords :
Z pinch; aluminium; explosions; plasma density; plasma diagnostics; plasma diodes; plasma temperature; plasma transport processes; time resolved spectra; visible spectra; 13kA 430ns rise time low current pulser 3; 20kA 200ns rise time low current pulser 4; 50ns rise time XP generator; Al; Zeeman broadening measurements; aluminum X pinch plasmas; current 13 kA; current 20 kA; electron density; electron temperature; imploding z-pinch; magnetic field measurement; time 200 ns; time 430 ns; time resolved visible spectroscopy; Aluminum; Educational institutions; Laboratories; Magnetic field measurement; Magnetic fields; Plasmas; Spectroscopy;
Conference_Titel :
Plasma Science (ICOPS), 2012 Abstracts IEEE International Conference on
Conference_Location :
Edinburgh
Print_ISBN :
978-1-4577-2127-4
Electronic_ISBN :
0730-9244
DOI :
10.1109/PLASMA.2012.6383922