DocumentCode :
2565374
Title :
Multiple fault diagnosis in sequential circuits using sensitizing sequence pairs
Author :
Yanagida, Nobuhiro ; Takahashi, Hiroshi ; Takamatsu, Yuzo
Author_Institution :
Dept. of Comput. Sci., Ehime Univ., Matsuyama, Japan
fYear :
1996
fDate :
25-27 Jun 1996
Firstpage :
86
Lastpage :
95
Abstract :
The paper presents an approach to multiple fault diagnosis in sequential circuits by using input sequence pairs having sensitizing input pairs. This represents an extension of our previous work dealing with combinational circuits (N. Yanagida et al., 1995). After reviewing our previous method, we introduce an input sequence pair having sensitizing input pairs to diagnose multiple faults in a sequential circuit partitioned into subcircuits. We call such an input sequence pair, the sensitizing sequence pair. Next, we extend the use of the previous method for combinational circuits to sequential circuits. From a relation between a sensitizing path generated by a sensitizing sequence pair and a subcircuit, the proposed method deduces the suspected faults for the subcircuits, one by one, based on the responses observed at primary outputs without probing any internal line. The paper provides the first experimental reports on diagnostic results of the ISCAS circuits by using our diagnostic method for sequential circuits, without probing any internal line, any fault simulation, or fault enumeration
Keywords :
combinational circuits; fault diagnosis; logic testing; sequential circuits; ISCAS circuits; combinational circuits; diagnostic method; diagnostic results; input sequence pair; input sequence pairs; multiple fault diagnosis; primary outputs; sensitizing input pairs; sensitizing sequence pairs; sequential circuits; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Computer science; Fault diagnosis; Fault location; Large scale integration; Logic testing; Sequential circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Fault Tolerant Computing, 1996., Proceedings of Annual Symposium on
Conference_Location :
Sendai
ISSN :
0731-3071
Print_ISBN :
0-8186-7262-5
Type :
conf
DOI :
10.1109/FTCS.1996.534597
Filename :
534597
Link To Document :
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