Characterization of active and passive millimeter-wave monolithic elements by on-wafer probing

A technique for modeling active and passive monolithic elements in a microstrip environment at millimeter-wave frequencies using on-wafer probing is developed. This procedure involves accurately characterizing the coplanar waveguide to microstrip transition used in making on-wafer measurements. Once the transition is characterized, the models for various elements can be determined. The proposed method is extremely useful for developing CAD (computer-aided design) models and enhancing monolithic circuit yields through adaptive processing.<>