Title :
High yield matching structures for 20% bandwidth microwave amplifiers
Author :
Brakensiek, W. ; Purviance, J. ; Ferguson, T.
Author_Institution :
Dept. of Electr. Eng., Idaho Univ., Moscow, ID, USA
Abstract :
Circuit yield is used as a criterion to choose among possible input-output, lumped, lossless, and two- and three-element matching structures, considering a bandwidth constraint on the match of 10% and 20%. A design chart is presented. An amplifier design example shows the use of the design chart and shows yield variations from 0% to 69% as a function of structure choice.<>
Keywords :
S-parameters; impedance matching; microwave amplifiers; solid-state microwave circuits; S-parameters; bandwidth constraint; circuit yield; design chart; microwave amplifiers; three-element matching structures; transistor amplifier; two-element matching structures; Bandwidth; Circuit optimization; Computational Intelligence Society; Frequency; Impedance; Laboratories; Microwave amplifiers; Microwave circuits; Pulp manufacturing; Radiofrequency amplifiers;
Conference_Titel :
Microwave Symposium Digest, 1989., IEEE MTT-S International
Conference_Location :
Long Beach, CA, USA
DOI :
10.1109/MWSYM.1989.38758
