• DocumentCode
    256563
  • Title

    An analysis of relationship between contact resistance and fracture of oxide film for connector contacts using finite element method

  • Author

    Kondo, T. ; Nakata, H. ; Sekikawa, J. ; Kubota, Y. ; Hayakawa, K. ; Nakamura, T.

  • Author_Institution
    Yazaki Parts Co., Ltd., Makinohara, Japan
  • fYear
    2014
  • fDate
    12-15 Oct. 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In automotive connectors, electrical current through the tin-plating flows as a result of fracture of the oxide film due to the expansion on the terminal surface area by contact load, and following metal to metal contact. It has been believed that the fracture can easily occur under mechanical contact of two mating terminals, since the oxide film on the tin-plated surface is only several nm thick. However, the whole process, from the fracture of oxide film, metal to metal contact, to the following decrease of contact resistance, has not been visualized by electrical and mechanical simulation. In the present paper, a method to analyze the oxide film fracture and following decrease of contact resistance was developed by using finite element method, to clarify the process of the fracture. It was found by using a single fine projection contact model, that the fracture of the oxide film took place where deformation of tin-plating was concentrated, since the oxide film was subject to tension by the plastic deformation of tin-plating. The change in the contact resistance after the oxide film fracture was also observed by current-flow analysis. Finally, the sudden decrease of the contact resistance observed at the certain contact load in experiment was successfully explained by the combination of single fine projection and multipoint contact models.
  • Keywords
    automotive electronics; contact resistance; electric connectors; electrical contacts; finite element analysis; fracture; plastic deformation; automotive connectors; connector contacts; contact resistance; current-flow analysis; electrical current; electrical simulation; finite element method; mating terminals; mechanical contact; mechanical simulation; metal to metal contact; multipoint contact models; oxide film fracture; plastic deformation; single fine projection contact model; terminal surface area; tin-plated surface; tin-plating deformation; Contact resistance; Films; Intermetallic; Surface cracks; Tin; automotive connector; contact resistance; current flow simulation; elastic-plastic deformation; oxide film fracture; tin plating;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts (Holm), 2014 IEEE 60th Holm Conference on
  • Conference_Location
    New Orleans, LA
  • Type

    conf

  • DOI
    10.1109/HOLM.2014.7031025
  • Filename
    7031025