Title :
Electrical ageing test on conventional and nanocomposite enamels: PD patterns analysis
Author :
Guastavino, F. ; Coletti, G. ; Ratto, A. ; Torello, E.
Author_Institution :
Electr. Eng. Dept., Univ. of Genova, Genoa, Italy
fDate :
May 31 2009-June 3 2009
Abstract :
In this work the partial discharge (PD) patterns acquired during electrical aging tests performed on twisted pair specimens prepared by winding wires having conventional or nanostructured enamel insulation are compared. The conventional enamel is polyamide imide, while the nanostructured enamel is a polyamide-silica nanocomposite. The tests have been performed applying sinusoidal voltage at different frequencies. The outcome shows interesting features of the PD activity monitored during the tests allowing a comparison between the two different insulating systems.
Keywords :
ageing; enamels; insulation; partial discharges; conventional enamels; electrical ageing test; enamel insulation; nanocomposite enamels; partial discharge patterns; Aging; Cable insulation; Dielectrics and electrical insulation; Frequency; Insulation testing; Partial discharges; Pattern analysis; Performance evaluation; Voltage; Wires;
Conference_Titel :
Electrical Insulation Conference, 2009. EIC 2009. IEEE
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4244-3915-7
Electronic_ISBN :
978-1-4244-3917-1
DOI :
10.1109/EIC.2009.5166404
