DocumentCode
2565695
Title
Test Case Reduction Based on Program Invariant and Genetic Algorithm
Author
Pan, Nenggang ; Zeng, Fanping ; Huang, Yu-Han
Author_Institution
Sch. of Comput. Sci. & Technol., Univ. of Sci. & Technol. of China, Hefei, China
fYear
2010
fDate
23-25 Sept. 2010
Firstpage
1
Lastpage
5
Abstract
Test case reduction is the focus of the field of software testing. In this paper, we integrate random testing methods, invariant technology and genetic algorithms for test case reduction. Program invariant here refers to the properties at some points of program, it can reveal the extent of program data coverage and other valuable information. We evaluate the parent program invariants to filter corresponding set of test cases, and keep the better ones on the offspring. Generation by generation, we can get the final reduced set of test cases. This method is easy to automate. Experimental results and analysis show that compared to similar methods, at the same coverage conditions, the method proposed in this paper have higher efficiency and can get better set of test cases.
Keywords
genetic algorithms; program testing; genetic algorithms; invariant technology; program invariant; random testing methods; software testing; test case reduction; Algorithm design and analysis; Heuristic algorithms; Optimization; Software; Software engineering; Software testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Wireless Communications Networking and Mobile Computing (WiCOM), 2010 6th International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-3708-5
Electronic_ISBN
978-1-4244-3709-2
Type
conf
DOI
10.1109/WICOM.2010.5601284
Filename
5601284
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