• DocumentCode
    2565844
  • Title

    Investigations of complex modes in a generalized bilateral finline with mounting grooves and finite conductor thickness

  • Author

    Weyl-Kuo Wang ; Ching-Kuang C.Tzuang ; Chun-Yi Shih ; Te-Hui Wang

  • Author_Institution
    Inst. of Commun. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • fYear
    1989
  • fDate
    13-15 June 1989
  • Firstpage
    491
  • Abstract
    A generalized bilateral finline with mounting grooves and finite conductor thickness is analyzed by the full-wave mode-matching method. The final nonstandard eigenvalue equation is derived from unknown coefficients in two slot regions. Both relative and absolute convergence analyses of complex modes are performed. The field patterns along the metallized strips are investigated for relative convergence studies. Once the optimal ratios of the numbers of expansion terms among different regions are decided, an absolute convergence study is initiated to obtain the minimal number of total modal expansion terms to save computer time. The validity of this approach is confirmed by checking the available complex mode data. Finally, the dispersion characteristics of fundamental, higher-order, evanescent, and complex modes are presented for an asymmetric bilateral finline. It is noted that the convergence studies presented provide a guideline to determine the numbers of modal expansion terms used in a millimeter-wave CAD (computer-aided design) program.<>
  • Keywords
    convergence; eigenvalues and eigenfunctions; fin lines; waveguide theory; MM-wave CAD program; absolute convergence analyses; bilateral finline; complex modes; dispersion characteristics; evanescent modes; field patterns; finite conductor thickness; full-wave mode-matching method; metallized strips; modal expansion terms; mounting grooves; nonstandard eigenvalue equation; relative convergence; slot regions; Conductors; Convergence; Design automation; Eigenvalues and eigenfunctions; Equations; Finline; Metallization; Mode matching methods; Performance analysis; Strips;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1989., IEEE MTT-S International
  • Conference_Location
    Long Beach, CA, USA
  • Type

    conf

  • DOI
    10.1109/MWSYM.1989.38773
  • Filename
    38773