Title :
Dielectric resonator used as a probe for high T/sub c/ superconductor measurements
Author :
Fiedziuszko, S.J. ; Heidmann, P.D.
Author_Institution :
Ford Aerosp. Corp., Palo Alto, CA, USA
Abstract :
A novel probe for high-T/sub c/ superconductor measurements based on the post dielectric resonator is described. Advantages of the device and the method of measurements include high sensitivity, simplicity, ability to measure small superconductor samples, and nondestructive measurements of selected areas of larger samples including thin-film superconductors. The technique and selected results are presented.<>
Keywords :
dielectric resonators; electric variables measurement; high-temperature superconductors; microwave measurement; nondestructive testing; probes; superconducting thin films; high temperature superconductor; nondestructive measurements; post dielectric resonator; probe; sensitivity; small superconductor samples; thin-film superconductors; Area measurement; Dielectric loss measurement; Dielectric measurements; Dielectric thin films; Electrical resistance measurement; High temperature superconductors; Probes; Superconducting materials; Superconducting microwave devices; Surface resistance;
Conference_Titel :
Microwave Symposium Digest, 1989., IEEE MTT-S International
Conference_Location :
Long Beach, CA, USA
DOI :
10.1109/MWSYM.1989.38788
