DocumentCode :
256615
Title :
Performance testing and evaluation of a Ag-W nano-crystalline silver alloy as a gold replacement in electrical connectors
Author :
Goodrich, T. ; Bui, K. ; Athans, A. ; Cahalen, J. ; Osborne, M. ; Stokoe, P.
Author_Institution :
Xtalic Corp., Marlborough, MA, USA
fYear :
2014
fDate :
12-15 Oct. 2014
Firstpage :
1
Lastpage :
7
Abstract :
Silver´s unique performance combination of excellent electrical and thermal conductivity has always been considered very desirable to be used in high signal density, electrical interconnect systems. However, silver´s poor mechanical performance, due to its lack of hardness and susceptibility to surface tarnishing, has limited silver´s applications to connector systems that require low durability and high contact normal forces, such as power connectors. This paper will present the material properties and results from reliability testing for a new electroplated nano-crystalline, cyanide free, silver alloy on a nickel barrier layer, that can be considered as an alternative finish for hard gold traditionally found in the separable interfaces of high signal density, electrical interconnect systems. The study shows the new silver alloy technology stack presented in this paper provides improvements to its mechanical, electrical, and thermal properties such that, in conjunction with the mechanical properties of the nickel corrosion barrier, should enable the technology stack to meet the performance requirements in accordance with the Telcordia GR-1217-CORE specification and EIA-364 test procedures.
Keywords :
durability; electric connectors; reliability; silver alloys; tungsten alloys; Ag-W; EIA-364 test procedure; Ni; Telcordia GR-1217-CORE specification; alternative finish; cyanide free silver alloy; electrical connector; electrical interconnect systems; electroplated nanocrystalline; gold replacement; material properties; mechanical performance; nanocrystalline silver alloy; nickel barrier layer; performance evaluation; performance testing; reliability testing; surface tarnishing; Connectors; Gold; Grain size; Silver; Thermal stability; connector; durability; gold alternative; silver nano-crystalline; thermal stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts (Holm), 2014 IEEE 60th Holm Conference on
Conference_Location :
New Orleans, LA
Type :
conf
DOI :
10.1109/HOLM.2014.7031051
Filename :
7031051
Link To Document :
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