Yield optimization of nonlinear circuits with statistically characterized devices

Author

Bandler, J.W. ; Zhang, Q.J. ; Song, J. ; Biernacki, R.M.

Author_Institution

Optimization Syst. Assoc. Inc., Dundas, Ont., Canada

fYear

1989

fDate

13-15 June 1989

Firstpage

649

Abstract

A comprehensive treatment of yield optimization of nonlinear microwave circuits with statistically characterized devices is proposed. The authors fully exploit advanced techniques of a one-sided l/sub 1/ circuit centering with gradient approximations and efficient harmonic balance simulation with exact Jacobians. Multidimensional statistical distributions of the intrinsic and parasitic parameters of field-effect transistors are fully handled. Yield is driven from 25% to 61% for a frequency doubler design having 34 statistically toleranced parameters. The yield of a small-signal amplifier is increased from 36% to 68%.<>

Keywords

circuit CAD; microwave circuits; nonlinear network synthesis; optimisation; solid-state microwave circuits; statistical analysis; CAD; exact Jacobians; field-effect transistors; gradient approximations; harmonic balance simulation; intrinsic parameters; microwave circuits; multidimensional statistical distributions; nonlinear circuits; one-sided l/sub 1/ circuit centering; parasitic parameters; statistically characterized devices; yield optimization; Circuit simulation; Computational modeling; Design optimization; Integrated circuit yield; Jacobian matrices; Microwave FETs; Microwave circuits; Microwave devices; Nonlinear circuits; Robustness;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1989., IEEE MTT-S International

Conference_Location

Long Beach, CA, USA

Type

conf

DOI

10.1109/MWSYM.1989.38809

Filename

38809