DocumentCode
2566637
Title
Bulk and surface micromachining of GaAs structures
Author
Hjort, Klas ; Schweitz, Jan-Åke ; Hök, Bertil
Author_Institution
Dept. of Technol., Uppsala Univ., Sweden
fYear
1990
fDate
11-14 Feb 1990
Firstpage
73
Lastpage
76
Abstract
Two separate schemes for bulk micromachining are presented together with experimental results on microfabricated cantilever beam structures indicating that conventional lithography and wet etching techniques can be used to produce geometrically well-defined, high-strength GaAs elements (fracture limits⩽4 GPa). A process scheme of surface micromachining is presented. The scheme is basically the same as for surface micromachining of polysilicon structures, but in a different materials system. It is realized by a combination of the multisequential epitaxy and the sacrificial layer technique used in the lift-off technique for epitaxial GaAs films. Some characteristics of surface micromachined GaAs structures are: single crystalline structures, wet etching may be used throughout, deposited layers are conformal to underlaying layers, low built-in stresses, and thick structures are possible
Keywords
III-V semiconductors; etching; gallium arsenide; internal stresses; lithography; surface treatment; GaAs; built-in stresses; bulk micromachining; fracture limits; lithography; microfabricated cantilever beam structures; multisequential epitaxy; sacrificial layer technique; single crystalline structures; surface micromachining; wet etching; Crystalline materials; Crystallization; Epitaxial growth; Gallium arsenide; Lithography; Micromachining; Stress; Structural beams; Surface cracks; Wet etching;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems, 1990. Proceedings, An Investigation of Micro Structures, Sensors, Actuators, Machines and Robots. IEEE
Conference_Location
Napa Valley, CA
Type
conf
DOI
10.1109/MEMSYS.1990.110252
Filename
110252
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