• DocumentCode
    2566902
  • Title

    An Ion Beam Sputtering System for Electrode Surface Conditioning

  • Author

    Wetz, D. ; Mankowski, J. ; Kristiansen, M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas Tech. Univ., Lubbock, TX
  • fYear
    2005
  • fDate
    20-23 June 2005
  • Firstpage
    123
  • Lastpage
    123
  • Abstract
    Summary form only given. In the past there has been considerable research performed using electromagnetic plasma thrusters as the primary ion source in sputtering applications. In the experiments conducted here, thin film coatings of various hard metallic alloys and oxides were applied to stainless steel electrodes using ion beam deposition. An SPT type Hall effect thruster capable of producing an ion beam with energies between 150 eV and 350 eV was used as the deposition ion source. The surface coatings were applied to Bruce profiled stainless steel electrodes which have an effective surface area of 5 cm2 and a roughness average of roughly 70 nm. The electrodes were then examined using an optical profiler to accurately measure the roughness average of the thin film coating as well as the effective layer thickness. A comparison of the results obtained from each surface material is performed
  • Keywords
    ion beam assisted deposition; metallic thin films; plasma materials processing; sputter deposition; sputtered coatings; stainless steel; surface roughness; surface treatment; 150 to 350 eV; Hall effect thruster; electrode surface conditioning; electromagnetic plasma thrusters; hard metallic alloys; ion beam deposition; ion beam sputtering; ion source; optical profiler; stainless steel electrodes; surface roughness; thin film coatings; Coatings; Electrodes; Ion beams; Ion sources; Optical films; Plasma applications; Rough surfaces; Sputtering; Steel; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2005. ICOPS '05. IEEE Conference Record - Abstracts. IEEE International Conference on
  • Conference_Location
    Monterey, CA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-9300-7
  • Type

    conf

  • DOI
    10.1109/PLASMA.2005.359087
  • Filename
    4198346