DocumentCode
2567346
Title
Qualification of surface mount technologies for random vibration in environmental stress screens
Author
Kyser, Edmond L.
Author_Institution
Tandem Comput. Inc., Cupertino, CA, USA
fYear
1997
fDate
13-16 Jan 1997
Firstpage
237
Lastpage
241
Abstract
High density surface mount technologies such as ball grid array and column grid array are less robust with respect to random vibration stress than leaded surface mount devices. Intermittent failures can occur under vibration stress that are not detectable when the stress is removed. The devices are more vulnerable to vibration stresses at high temperature (80°C) than at low (-30°C). Guidelines for optimized vibration levels in environmental stress screens can be determined from damage data obtained using Miner´s rule
Keywords
dynamic testing; environmental stress screening; printed circuit testing; surface mount technology; Miner´s rule; damage data; environmental stress screens; high density surface mount technologies; high temperature; intermittent failures; multi-layer printed wiring board; optimized vibration levels; random vibration; random vibration stress; Ceramics; Connectors; Electronic switching systems; Electronics packaging; Plastics; Qualifications; Stress; Surface-mount technology; Temperature; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium. 1997 Proceedings, Annual
Conference_Location
Philadelphia, PA
ISSN
0149-144X
Print_ISBN
0-7803-3783-2
Type
conf
DOI
10.1109/RAMS.1997.571714
Filename
571714
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