• DocumentCode
    2567346
  • Title

    Qualification of surface mount technologies for random vibration in environmental stress screens

  • Author

    Kyser, Edmond L.

  • Author_Institution
    Tandem Comput. Inc., Cupertino, CA, USA
  • fYear
    1997
  • fDate
    13-16 Jan 1997
  • Firstpage
    237
  • Lastpage
    241
  • Abstract
    High density surface mount technologies such as ball grid array and column grid array are less robust with respect to random vibration stress than leaded surface mount devices. Intermittent failures can occur under vibration stress that are not detectable when the stress is removed. The devices are more vulnerable to vibration stresses at high temperature (80°C) than at low (-30°C). Guidelines for optimized vibration levels in environmental stress screens can be determined from damage data obtained using Miner´s rule
  • Keywords
    dynamic testing; environmental stress screening; printed circuit testing; surface mount technology; Miner´s rule; damage data; environmental stress screens; high density surface mount technologies; high temperature; intermittent failures; multi-layer printed wiring board; optimized vibration levels; random vibration; random vibration stress; Ceramics; Connectors; Electronic switching systems; Electronics packaging; Plastics; Qualifications; Stress; Surface-mount technology; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium. 1997 Proceedings, Annual
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-3783-2
  • Type

    conf

  • DOI
    10.1109/RAMS.1997.571714
  • Filename
    571714