• DocumentCode
    2567416
  • Title

    Error estimation for solution verification of stochastic problems in PIC plasma models

  • Author

    Musson, Lawrence C. ; Cartwright, Keith L. ; Radtke, Gregg A. ; Hopkins, Polly L. ; Hopkins, Matthew M.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    2012
  • fDate
    8-13 July 2012
  • Abstract
    When approximate methods are used to solve equations that represent a physical system of interest, a reliable and robust method of estimating the error and the convergence behavior of the model is critical to understand the quality of the solutions obtained. We present the current state of a method we´re developing to estimate error with stochastic particle-in-cell plasma models as the target model application. Richardson extrapolation is a long tried and often very useful method for investigating the error we´re interested in here. The standard application of Richardson extrapolation, however, is not adequate for our stochastic models, and so we´re extending it to suit our purpose. Foremost, a least squares method is employed to estimate the Richardson parameters from a sample of system responses. Additionally, we employ a stochastic extension of Richardson extrapolation to estimate error bounds on the parameters themselves. A Child-Langmuir diode and a sheath of ionized hydrogen are presented as quasi-steady examples of the current method.
  • Keywords
    error analysis; extrapolation; least squares approximations; plasma diodes; plasma sheaths; plasma simulation; stochastic processes; Child-Langmuir diode; PIC plasma model; Richardson extrapolation; convergence behavior; error estimation; ionized hydrogen sheath; least squares method; physical system; stochastic particle-in-cell plasma models; stochastic problems; Error analysis; Extrapolation; Laboratories; Mathematical model; Plasmas; Stochastic processes; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science (ICOPS), 2012 Abstracts IEEE International Conference on
  • Conference_Location
    Edinburgh
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-4577-2127-4
  • Electronic_ISBN
    0730-9244
  • Type

    conf

  • DOI
    10.1109/PLASMA.2012.6384055
  • Filename
    6384055