• DocumentCode
    2568005
  • Title

    Reliability prediction: the turn-over point

  • Author

    Talmor, Michael ; Arueti, Shimshon

  • Author_Institution
    Reliability Centre, Rafael, Haifa, Israel
  • fYear
    1997
  • fDate
    13-16 Jan 1997
  • Firstpage
    254
  • Lastpage
    262
  • Abstract
    The main objective of this paper is to present an approach for a practical, easy to implement reliability prediction procedure. The proposed procedure is based upon the combined use of a number of reliability data sources, calculation methods and deterministic models. The procedure includes “tailoring” of the models according to their defined criteria, and with emphasis on the use of deterministic models whenever appropriate and possible. The criteria for reliability data sources and models are defined. The paper emphasizes, as most important, the use of inside manufacturing data from different production stages. It details mathematical principles for the use of information from incoming inspection, from environmental stress screening (ESS) and from the field. A reliability test of PCB leads for “parametric” deterministic reliability modeling, is illustrated. Some advantages of the recommended methodology are: improved accuracy of reliability prediction; simplicity of use; and incorporation of product line information. This approach is useful not only for reliability prediction, but also for providing engineering feedback for reliability improvements
  • Keywords
    deterministic algorithms; failure analysis; probability; reliability theory; calculation methods; engineering feedback; environmental stress screening; model tailoring; parametric deterministic reliability models; reliability data sources; reliability improvements; reliability prediction procedure; turn-over point; Degradation; Failure analysis; Life estimation; Predictive models; Production; Q factor; Random access memory; Reliability engineering; Testing; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium. 1997 Proceedings, Annual
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-3783-2
  • Type

    conf

  • DOI
    10.1109/RAMS.1997.571717
  • Filename
    571717