DocumentCode :
2568108
Title :
SWITTEST: Automatic Switch-level Fault Simulation And Test Evaluation Of Switched-capacitor Systems
Author :
Mir, S. ; Rueda, Andrea ; Olbrich, T. ; Peralías, E. ; Huertas, J.L.
Author_Institution :
Instituto de Microelectronica de Sevilla
fYear :
1997
fDate :
9-13 June 1997
Firstpage :
281
Lastpage :
286
Keywords :
Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Integrated circuit testing; Permission; Switching circuits; System testing; Time domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1997. Proceedings of the 34th
Conference_Location :
Anaheim, CA, USA
ISSN :
0738-100X
Print_ISBN :
0-7803-4093-0
Type :
conf
DOI :
10.1109/DAC.1997.597158
Filename :
597158
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2568108
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