DocumentCode
2568208
Title
Design of a Passive Shock Break-Out Diagnostic on the Z Facility
Author
Thomas, R.D. ; Joseph, N.R. ; Feck, D.W. ; Rochau, G.A. ; Chandler, G.A.
Author_Institution
Ktech Corp., Albuquerque, NM
fYear
2005
fDate
20-23 June 2005
Firstpage
156
Lastpage
156
Abstract
Summary form only given. Shock propagation velocity in Al witness plates is a well established method for diagnosing radiation temperature environments in laser driven hohlraums. The same principles can be applied to infer radiation environments in the Z-pinch driven dynamic hohlraum. Here we present the initial design of a passive shock break-out (PSBO) diagnostic on the Z facility at Sandia National Laboratories. Visible light emission from the shock break-out is captured through an achromatic lens assembly and imaged onto a linear array of single mode optical fiber. The light is transferred down ~50 ft. of fiber-optic, and imaged through a narrow-width band-pass filter onto an LCA-4 streak camera. Due to its close-proximity to the Z-pinch target, the front-end imaging assembly of the PSBO system is designed to be replaced on every experiment. The first test of this system has demonstrated the capability to capture a ~1 eV break-out signal from Al steps as thick as 90 mum, thereby showing promise as a radiation temperature diagnostic on the dynamic hohlraum
Keywords
Z pinch; aluminium; plasma diagnostics; plasma light propagation; plasma shock waves; plasma temperature; 90 mum; Al; LCA-4 streak camera; Z facility; Z-pinch driven dynamic hohlraum; achromatic lens assembly; laser driven hohlraums; narrow-width band-pass filter; passive shock break-out diagnostic; radiation temperature; shock propagation velocity; single mode optical fiber; visible light emission; Assembly; Band pass filters; Electric shock; Laboratories; Lenses; Optical arrays; Optical fiber testing; Optical fibers; Optical propagation; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 2005. ICOPS '05. IEEE Conference Record - Abstracts. IEEE International Conference on
Conference_Location
Monterey, CA
ISSN
0730-9244
Print_ISBN
0-7803-9300-7
Type
conf
DOI
10.1109/PLASMA.2005.359153
Filename
4198412
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